The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Mar. 27, 2015
Carl Zeiss Microscopy Gmbh, Jena, DE;
Marco Pretorius, Oberkochen, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
An arrangement for lightsheet microscopy. In the arrangement, a detection objective includes a first adaptive optical detection correction element arranged in the beam path or which can be introduced into the latter. Alternatively, or in addition, an illumination objective includes a first adaptive optical illumination correction element arranged in the beam path or which can be introduced into the latter. With the two correction elements, aberrations which occur because of the inclined passage through boundary surfaces of the separating layer system of light to be detected or of light for illuminating the sample can be reduced for a predetermined range of detection angles (δ) or of illumination angles (β) and/or for a predetermined range of the thickness of the at least one layer of the separating layer system.