The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

Oct. 07, 2014
Applicant:

Theranos Ip Company, Llc, New York, NY (US);

Inventors:

Karan Mohan, Palo Alto, CA (US);

Chinmay Pangarkar, Palo Alto, CA (US);

James R. Wasson, Palo Alto, CA (US);

Assignee:

Theranos IP Company, LLC, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/569 (2006.01); B01L 3/00 (2006.01); G01N 21/64 (2006.01); G02B 7/09 (2006.01); G01N 21/03 (2006.01); G01N 21/05 (2006.01); G02B 21/08 (2006.01); G01N 21/17 (2006.01); G02B 21/00 (2006.01); G02B 21/12 (2006.01); G02B 21/24 (2006.01); G01N 33/487 (2006.01); G01N 33/49 (2006.01); G01N 21/27 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G01N 33/56972 (2013.01); B01L 3/502715 (2013.01); G01N 21/0303 (2013.01); G01N 21/05 (2013.01); G01N 21/17 (2013.01); G01N 21/27 (2013.01); G01N 21/645 (2013.01); G01N 21/6428 (2013.01); G01N 21/6458 (2013.01); G01N 21/6486 (2013.01); G01N 33/487 (2013.01); G01N 33/49 (2013.01); G01N 33/56966 (2013.01); G02B 7/09 (2013.01); G02B 21/0076 (2013.01); G02B 21/088 (2013.01); G02B 21/125 (2013.01); G02B 21/16 (2013.01); G02B 21/244 (2013.01); G02B 21/365 (2013.01); G01N 2021/1738 (2013.01); G01N 2021/6439 (2013.01); G01N 2201/061 (2013.01); G01N 2201/12 (2013.01); G01N 2333/70589 (2013.01); G01N 2333/70596 (2013.01);
Abstract

Methods, devices, apparatus, and systems are provided for image analysis. Methods of image analysis may include observation, measurement, and analysis of images of biological and other samples; devices, apparatus, and systems provided herein are useful for observation, measurement, and analysis of images of such samples. The methods, devices, apparatus, and systems disclosed herein provide advantages over other methods, devices, apparatus, and systems.


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