The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2019

Filed:

May. 01, 2017
Applicant:

Lam Research Corporation, Fremont, CA (US);

Inventor:

Zhian He, Lake Oswego, OR (US);

Assignee:

Lam Research Corporation, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23D 17/00 (2006.01); C25D 17/00 (2006.01); C25D 5/08 (2006.01); C25D 17/06 (2006.01); C25D 21/10 (2006.01); H01L 21/288 (2006.01); H01L 21/768 (2006.01); C25D 7/12 (2006.01); C25D 17/10 (2006.01);
U.S. Cl.
CPC ...
C25D 17/001 (2013.01); C25D 5/08 (2013.01); C25D 17/007 (2013.01); C25D 17/008 (2013.01); C25D 17/06 (2013.01); C25D 21/10 (2013.01); H01L 21/2885 (2013.01); H01L 21/76879 (2013.01); C25D 7/123 (2013.01); C25D 17/10 (2013.01);
Abstract

An electroplating apparatus that promotes uniform electroplating on the substrates having thin seed layers includes a convex anisotropic high resistance ionic current source (AHRICS), such as an electrolyte-permeable resistive domed plate. The AHRICS is positioned in close proximity of the substrate, so that a distance from the central portion of the AHRICS to the substrate is smaller than the distance from the edge portion of the AHRICS to the substrate. The apparatus further includes a plating chamber configured to hold the electrolyte and an anode. The apparatus further includes a substrate holder configured to hold the substrate. In some embodiments, the apparatus further includes a secondary (thief) cathode configured to divert ionic current from the near-edge region of the substrate.


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