The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2019

Filed:

Sep. 26, 2016
Applicant:

Hitachi Kokusai Electric Inc., Tokyo, JP;

Inventors:

Hirohisa Yamazaki, Toyama, JP;

Noriyuki Isobe, Toyama, JP;

Hiroshi Ashihara, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 16/40 (2006.01); H01L 21/02 (2006.01); H01L 21/033 (2006.01); H01L 29/78 (2006.01); C23C 16/455 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02186 (2013.01); C23C 16/405 (2013.01); C23C 16/45531 (2013.01); H01L 21/022 (2013.01); H01L 21/0228 (2013.01); H01L 21/0337 (2013.01); H01L 29/7843 (2013.01);
Abstract

Provided is a technique for forming a film having a desired stress on a substrate. A method of manufacturing a semiconductor device includes: forming a film having a predetermined stress on a substrate by controlling a ratio of a thickness of a first film having compressive stress to a thickness of a second film having tensile stress by performing: (a) supplying an organic source gas containing a first element and a reactive gas containing a second element to the substrate to form the first film containing the first element and the second element; and (b) supplying an inorganic source gas containing the first element and the reactive gas to the substrate to form the second film containing the first element and the second element.

Published as:
US2017092490A1; JP2017069433A; JP6163524B2; US10297440B2;

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