The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2019

Filed:

Feb. 19, 2014
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Brent Thordarson, San Jose, CA (US);

John W. Andberg, Santa Cruz, CA (US);

Koei Nishiura, Kumagaya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05D 23/00 (2006.01); G01R 31/10 (2006.01); G01R 31/00 (2006.01); G06F 1/20 (2006.01); H05K 5/00 (2006.01); H05K 7/20 (2006.01); G11C 29/56 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G11C 29/56016 (2013.01); G01R 31/2834 (2013.01); G01R 31/2851 (2013.01); G01R 31/2877 (2013.01); H05K 7/20218 (2013.01); H05K 7/20236 (2013.01);
Abstract

Example features or aspects of the present invention are described in relation to a small, quiet integrated cooling system for an apparatus for testing electronic devices. Characteristics of the test apparatus including a low noise output, low power consumption and a compact size with a small spatial and volume footprint are selected for deployment and use in a an office like environment. The test apparatus comprises a chassis frame and a cooler frame disposed within the chassis frame and thus integrated within the test apparatus, which has a reduced form factor suitable for the in-office deployment. Embodiments offer the ability to maintain the working fluid at a constant temperature.


Find Patent Forward Citations

Loading…