The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2019
Filed:
Oct. 28, 2016
Applicant:
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CA (US);
Inventors:
Zhifeng Huang, Pleasanton, CA (US);
Thomas A. Case, Walnut Creek, CA (US);
Assignee:
Carl Zeiss X-Ray Microscopy, Inc., Pleasanton, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01); G06T 5/00 (2006.01); H04N 5/32 (2006.01);
U.S. Cl.
CPC ...
G06T 11/008 (2013.01); G06T 5/002 (2013.01); H04N 5/32 (2013.01); G06T 2211/40 (2013.01); G06T 2211/408 (2013.01);
Abstract
A segmentation-and-spectrum-based metal artifact reduction (MAR) system and method is applied in polychromatic X-ray CT system that uses a priori knowledge of high-Z metals in samples which contribute the primary artifacts at a known x-ray energy spectrum. Using a basis materials decomposition, the method solves the problem of reducing or eliminating metal artifacts associated with beam hardening using only a single scan of the sample performed at selected x-ray energy.