The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2019

Filed:

Jul. 22, 2015
Applicant:

Jeol Ltd., Tokyo, JP;

Inventors:

Kenichi Hachitani, Tokyo, JP;

Takeshi Tsukada, Tokyo, JP;

Tetsuro Sugita, Tokyo, JP;

Takayuki Suzuki, Tokyo, JP;

Assignee:

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/46 (2006.01); G01R 33/36 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4625 (2013.01); G01R 33/36 (2013.01); G01R 33/3621 (2013.01);
Abstract

In a magnetic resonance measurement apparatus such as an NMR measurement apparatus, when a frequency of an observation nucleus falls within a high frequency band, an RF reception signal is converted into an intermediate frequency signal, and is input to an analog-to-digital converter. In this case, under-sampling is executed for the intermediate frequency signal in the analog-to-digital converter, and a second-order aliased signal component generated from a target signal component is observed. On the other hand, when the frequency of the observation nucleus falls within a low frequency band, over-sampling for the RF reception signal is executed.


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