The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2019
Filed:
Jun. 30, 2017
Intel Corporation, Santa Clara, CA (US);
Abram M Detofsky, Tigard, OR (US);
Brett E Klehn, Santa Clara, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
An optical spectral analyzer for measuring an optical multi-channel signal by separating the multi-channel signal and measuring a plurality of single-channel signals simultaneously. The spectral analyzer can include a demultiplexer configured to receive the multi-channel signal. The multi-channel signal can be a multi-channel wavelength range. The demultiplexer can separate the multi-channel signal into the plurality of single-channel signals including a first single-channel signal and a second single-channel signal. The spectral analyzer can include a plurality of optical paths. The plurality of optical paths can include a plurality of respective detectors for measuring an optical power of the respective single-channel signals. The detectors can convert the optical power of the respective single-channel signals to corresponding electrical signals. In some examples, the spectral analyzer includes a controller configured to obtain the plurality of respective electrical signals simultaneously to correspondingly detect the optical power of the multi-channel signal across the multi-channel wavelength range.