The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Jul. 10, 2017
Jeol Ltd., Tokyo, JP;
Ayumi Kubo, Tokyo, JP;
JEOL Ltd., Tokyo, JP;
Abstract
A mass spectrometry data analysis method for analyzing a specimen having a composition where two different reference chemical structures A and B that are each repeated, includes acquiring exact mass information of each peak in a mass spectrum of the specimen by mass spectrometry, acquiring Kendrick mass defect information Dand Dwhere a decimal number part has been extracted from mass information obtained by performing Kendrick mass conversion computation processing on exact mass information of each peak, acquiring mass defect information dand dwhere a decimal number part has been extracted from mass information of B based on A and A based on B of the reference chemical structures A and B, calculatingregarding D, D, d, and d, and obtaining degree-of-polymerization information nand n, and displaying plots corresponding to each peak on two-dimensional coordinates where nand nare axes.