The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Jun. 26, 2015
Applicant:

Here Global B.v., Veldhoven, NL;

Inventors:

Anish Mittal, Berkeley, CA (US);

William Marks, San Francisco, CA (US);

Assignee:

HERE Global B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/66 (2006.01); G06K 9/03 (2006.01); G06K 9/20 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/66 (2013.01); G06K 9/036 (2013.01); G06K 9/2054 (2013.01); G06K 9/4642 (2013.01); G06K 9/4661 (2013.01); G06T 2207/30168 (2013.01);
Abstract

An approach is provided for automated analysis and classification of quality characteristics associated with captured imagery that may be used in an application such as a map application. The approach includes determining digital data associated with a region of interest in an image. The approach also comprises processing and/or facilitating a processing of the digital data to determine one or more quality attributes associated with the region of interest. The approach further comprises causing, at least in part, a comparison of the one or more quality attributes to one or more criteria. The approach also comprises causing, at least in part, a generation of one or more classifications for the image based, at least in part, on the comparison.


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