Systems and methods for performing electromigration and voltage drop verification in electronic circuit designs

Abstract

Disclosed herein are systems and methods to perform electrical analysis of a circuit design to verify electrical behavior and performance of the circuit design in a two-step process. Initially, a simulator transient analysis is performed on circuit blocks of a circuit design to obtain a current through each device path in each circuit block, and using the current obtained the IR drop and EM problems are examined to get EM-IR drop analysis. Next, a simulator transient analysis is performed on a top level circuit of a circuit design and current values generated in a first step to obtain EM-IR drop analysis for a full circuit design such that a circuit designer may debug, analyze and visualize various IR and EM value plots for circuit blocks and top level circuit of the circuit design together or separately.