The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Sep. 05, 2016
Applicant:

Freescale Semiconductor, Inc., Austin, TX (US);

Inventors:

Xiong Xiao, Shanghai, CN;

Zhenyong Chen, Shanghai, CN;

Xianzhong Li, Shanghai, CN;

Assignee:

NXP USA, INC., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 16/285 (2019.01);
Abstract

A data-clustering method generates data clusters for a set of data points. A region of interest containing the data points and a center matrix for the region of interest are defined, where the center matrix includes an array of center points defining centers of overlapping circles. The data points are mapped to corresponding circles based on near center points. Pairs of overlapping circles are merged based on relative numbers of data points lying in overlap regions of the pairs of overlapping circles compared to total numbers of data points within the corresponding circles. Circles belonging to the one or more data clusters are identified based on merged pairs of overlapping circles, and data points belonging to the one or more data clusters are identified based on the corresponding circles. The method may be performed by a computer having a heterogeneous architecture with parallel processors.


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