The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2019
Filed:
Apr. 22, 2015
Hitachi High-technologies Corporation, Tokyo, JP;
Hideto Tamezane, Tokyo, JP;
Isao Yamazaki, Tokyo, JP;
Masaharu Nishida, Tokyo, JP;
Kumiko Kamihara, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
A pressure signal process unit acquires data under a predetermined condition and a statistic distance between the acquired data and determination-purpose reference data stored in a storage unit is calculated. It is determined whether or not dispensing is abnormal and whether the determination-purpose reference data is suitable for an abnormality detection function to be properly fulfilled. If the determination-purpose reference data is not suitable for an abnormality detection function to be properly fulfilled, temporary determination-purpose reference data is prepared so as to be compared with the previously acquired data under a predetermined condition. If a difference therebetween is greater than a predetermined threshold value, a possibility that an automatic analyzer may have an abnormal component or that a failure may occur in the automatic analyzer is determined, and the result is transmitted to cause a display device to display an alarm.