The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Aug. 11, 2016
Applicant:

Eo Technics Co., Ltd., Anyang-si, Gyeonggi-do, KR;

Inventors:

Dong Jun Lee, Seoul, KR;

Dong Won Hyun, Suwon-si, KR;

Byung Oh Kim, Seoul, KR;

Assignee:

EO TECHNICS CO., LTD., Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); B23K 26/046 (2014.01); B23K 26/02 (2014.01); B23K 26/03 (2006.01); B23K 26/04 (2014.01); B23K 26/06 (2014.01); B23K 26/08 (2014.01); G01B 11/06 (2006.01); G01B 11/14 (2006.01); G02B 26/08 (2006.01); G02B 27/14 (2006.01); G02B 7/28 (2006.01);
U.S. Cl.
CPC ...
B23K 26/046 (2013.01); B23K 26/02 (2013.01); B23K 26/03 (2013.01); B23K 26/032 (2013.01); B23K 26/04 (2013.01); B23K 26/06 (2013.01); B23K 26/0648 (2013.01); B23K 26/08 (2013.01); G01B 11/06 (2013.01); G01B 11/0608 (2013.01); G01B 11/14 (2013.01); G02B 7/28 (2013.01); G02B 26/0875 (2013.01); G02B 27/141 (2013.01);
Abstract

The laser processing device includes: a measuring device configured to measure a change in a height of an object and including a first light source configured to emit probe light, a first light focusing unit configured to focus the probe light on the object, a light sensing unit configured to detect a change in the probe light reflected from a reflective surface of the object and including a Shack-Hartmann sensor, and a calculation unit configured to calculate the change in the height of the object by using the change in the reflected light detected by the light sensing unit; a second light source configured to emit laser light for processing to the object; and a focus adjusting device configured to adjust a focus of the laser light emitted to the object by using the change in the height of the object to be processed measured by the measuring device.


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