The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2019
Filed:
May. 03, 2016
Applicant:
Rigaku Corporation, Akishima-shi, Tokyo, JP;
Inventors:
Masahiro Nonoguchi, Tachikawa, JP;
Manabu Noguchi, Tachikawa, JP;
Koichi Kato, Fussa, JP;
Ryuji Nishida, Higashikurume, JP;
Yuji Kusaka, Hokuto, JP;
Masashi Kageyama, Hachioji, JP;
Tomohiro Chaki, Tachikawa, JP;
Assignee:
RIGAKU CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 35/02 (2006.01); H01J 35/08 (2006.01); H01J 35/14 (2006.01); H05G 1/26 (2006.01); H05G 1/02 (2006.01);
U.S. Cl.
CPC ...
H01J 35/14 (2013.01); H01J 35/025 (2013.01); H01J 35/08 (2013.01); H05G 1/02 (2013.01); H05G 1/26 (2013.01); H01J 2235/081 (2013.01); H01J 2235/086 (2013.01); H01J 2235/088 (2013.01);
Abstract
Provided are an X-ray generator capable of easily measuring a beam size of an electron beam on an electron target, and an adjustment method therefor. The X-ray generator includes an electron target including a first metal, a second metal different from the first metal, and a third metal different from the second metal, which are sequentially arranged side by side along a first direction in a continuous manner.