The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2019
Filed:
Mar. 02, 2016
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventor:
Rolf Wartmann, Waake, DE;
Assignee:
Carl Zeiss Microscopy GMBH, Jena, DE;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 27/00 (2006.01); G02B 21/24 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0016 (2013.01); G02B 21/006 (2013.01); G02B 21/241 (2013.01); G02B 27/0068 (2013.01);
Abstract
The invention relates to a system for spherically correcting imaging of a three-dimensional object, comprising a microscope comprising an immersion medium and an embedding medium for holding the three-dimensional object separated from the immersion medium of the microscope by a boundary surface or a cover slip. According to the invention, the thickness (Δs) of the immersion medium and the position (Δs') of the primary intermediate image of the three-dimensional object can be variably modified.