The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Feb. 15, 2018
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Biswanath Senapati, Mechanicville, NY (US);

Jagar Singh, Clifton Park, NY (US);

Assignee:

GLOBALFOUNDRIES Inc., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/735 (2006.01); H01L 29/08 (2006.01); H01L 29/10 (2006.01); H01L 29/06 (2006.01); H01L 27/06 (2006.01); G01R 31/26 (2014.01); G01R 31/28 (2006.01); H01L 21/66 (2006.01); H01L 29/417 (2006.01); H01L 29/423 (2006.01); H01L 27/02 (2006.01);
U.S. Cl.
CPC ...
H01L 29/735 (2013.01); G01R 31/2621 (2013.01); G01R 31/2884 (2013.01); H01L 22/34 (2013.01); H01L 27/0259 (2013.01); H01L 27/0623 (2013.01); H01L 29/0649 (2013.01); H01L 29/0692 (2013.01); H01L 29/0808 (2013.01); H01L 29/0821 (2013.01); H01L 29/1008 (2013.01); H01L 29/1095 (2013.01); H01L 29/41708 (2013.01); H01L 29/42304 (2013.01);
Abstract

A symmetrical lateral bipolar junction transistor (SLBJT) is provided. The SLBJT includes a p-type semiconductor substrate, a n-type well, an emitter of a SLBJT situated in the n-type well, a base of the SLBJT situated in the n-type well and spaced from the emitter by a distance on one side of the base, a collector of the SLBJT situated in the n-type well and spaced from the base by the distance on an opposite side of the base, and an electrical connection to the substrate outside the n-type well. The SLBJT is used to characterize a transistor in a circuit by electrically coupling the SLBJT to a gate of the test transistor, applying a voltage to the gate, and characterizing aspect(s) of the test transistor under the applied voltage. The SLBJT protects the gate against damage to the gate dielectric.


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