The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Dec. 05, 2016
Applicant:

Xilinx, Inc., San Jose, CA (US);

Inventors:

Gamal Refai-Ahmed, Santa Clara, CA (US);

Suresh Ramalingam, Fremont, CA (US);

Brian D. Philofsky, Longmont, CO (US);

Anthony Torza, Oakland, CA (US);

Assignee:

XILINX, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/22 (2006.01); H01L 23/24 (2006.01); H01L 23/427 (2006.01); H01L 23/055 (2006.01); H01L 23/367 (2006.01); H01L 23/10 (2006.01);
U.S. Cl.
CPC ...
H01L 23/4275 (2013.01); H01L 23/055 (2013.01); H01L 23/10 (2013.01); H01L 23/3672 (2013.01); H01L 23/427 (2013.01);
Abstract

Chip packages and electronic devices are provided that include a thermal capacitance element that improves the operation of IC dies at elevated temperatures. In one example, a chip package is provided that includes an integrated circuit (IC) die, a lid thermally connected to the IC die, and a thermal capacitance element thermally connected to the lid. The thermal capacitance element includes a container and a capacitance material sealingly disposed in the container. The capacitance material has a phase transition temperature that is between 80 and 100 percent of a maximum designed operating temperature in degrees Celsius of the IC die.


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