The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2019
Filed:
Nov. 11, 2015
Carl Zeiss Microscopy Gmbh, Jena, DE;
Carl Zeiss Ag, Oberkochen, DE;
Daniel Schwedt, Weimar, DE;
Tiemo Anhut, Jena, DE;
Matthias Wald, Jena, DE;
Beate Böhme, Broßpürschütz, DE;
Tobias Kaufhold, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
Beam deflection units in light-scanning microscopes are usually arranged in planes that are conjugate to the objective pupil. The scan optics, which is required for generating the conjugate pupil planes, is complicated and not very light efficient. The invention is intended to enable a higher image quality, simpler adjustment and a lower light loss microscope. The optical system comprises a concave mirror () for imaging a respective point of the first and second beam deflection units (A,B) onto one another. The concave mirror (), the first beam deflection unit (A), and the second beam deflection unit (B) are arranged such that the illumination beam path is reflected exactly once at the concave mirror (). A first distortion caused by the concave mirror () and a second distortion of the imaging caused by the first and second beam deflection units (A,B) at least partly compensate for one another.