The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2019

Filed:

Jul. 30, 2018
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Tomonori Morita, Kanagawa, JP;

Aya Yamamoto, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04W 24/00 (2009.01); H04B 17/29 (2015.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
H04B 17/29 (2015.01); G01R 29/0871 (2013.01); G01R 29/0892 (2013.01);
Abstract

In a measuring system in which a wireless terminal that is a measurement target is rotated centering around the standard point O at each rotation angle of the wireless terminal, and thus a reception performance is acquired, when the reception performance is obtained, a power of a measurement signal that is supplied to the measurement antenna is corrected for a propagation loss error and a gain error that occur in association with rotation of the wireless terminal, angle correction for an angle error that occurs in association with the rotation of the wireless terminal is performed on the reception performance at each rotation angle, which is acquired with the measure signal having the corrected power, and thus the reception performance in a case where it is assumed that a terminal antenna of the wireless terminal is rotated at a position of a standard points is obtained.


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