The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2019

Filed:

Jan. 11, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Abraham Arceo De La Pena, Albany, NY (US);

Ekmini A. De Silva, Albany, NY (US);

Nelson M. Felix, Albany, NY (US);

Sivananda K. Kanakasabapathy, Niskayuna, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/311 (2006.01); H01L 21/3213 (2006.01); H01L 21/027 (2006.01); H01L 21/768 (2006.01); H01L 21/02 (2006.01); G03F 7/09 (2006.01);
U.S. Cl.
CPC ...
H01L 21/32139 (2013.01); G03F 7/091 (2013.01); H01L 21/0276 (2013.01); H01L 21/02186 (2013.01); H01L 21/02266 (2013.01); H01L 21/32134 (2013.01); H01L 21/76892 (2013.01);
Abstract

Lithographic multilayer structures are disclosed that generally include an organic planarizing layer and a tunable titanium oxynitride layer on the organic planarizing layer, wherein the titanium oxynitride includes TiOxNy, and wherein x is from 2.5 to 3.5 and y is from 0.75 to 1.25. The lithographic multilayer structure further includes a photosensitive resist layer on the titanium oxynitride layer. The tunable titanium oxynitride is configured to function as a hard mask and as an antireflective coating. Also disclosed are methods for patterning the lithographic multilayer structures.


Find Patent Forward Citations

Loading…