The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Jun. 23, 2017
Applicant:

Winbond Electronics Corp., Taichung, TW;

Inventors:

Masaru Yano, Taichung, TW;

Pin-Yao Wang, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 19/00 (2018.01); H01L 23/00 (2006.01); H01L 23/544 (2006.01); G05B 19/12 (2006.01); G11C 16/22 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
H01L 23/544 (2013.01); G05B 19/128 (2013.01); G11C 16/22 (2013.01); H01L 22/20 (2013.01); H01L 24/49 (2013.01); G06F 17/5072 (2013.01); G06F 17/5081 (2013.01); G06F 19/00 (2013.01); H01L 2223/5444 (2013.01);
Abstract

A semiconductor device with improved generation function of unique information is provided. The semiconductor device includes an integrated circuit designed or fabricated based on a general design condition or manufacturing condition, an input/output circuit, and a unique-information generation circuit to generate unique information of the semiconductor device. The unique-information generation circuit includes a circuit for PUF and a code-generation unit. The circuit for PUF is fabricated based on the design condition or manufacturing condition which is different from the general design condition or manufacturing condition and has a factor which makes variations of circuit components become large. The code-generation unit generates codes based on the output of the circuit for PUF.


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