The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Mar. 18, 2015
Applicant:

GE Sensing & Inspection Technologies Gmbh, Hürth, DE;

Inventor:

Ralf Ratering, Hürth, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/26 (2006.01); G01N 29/22 (2006.01);
U.S. Cl.
CPC ...
G01N 29/226 (2013.01); G01N 29/22 (2013.01); G01N 29/262 (2013.01); G01N 2291/0289 (2013.01);
Abstract

The present embodiments relate to a device for the non-destructive ultrasound testing of workpieces. The device comprises an ultrasonic test probe with an ultrasonic transducer, the ultrasonic test probe being configured for generating and coupling ultrasonic signals into a workpiece or/and for receiving ultrasonic signals from the workpiece. Furthermore, an electronic control unit is provided. The ease of operation is improved as a whole by a special configuration of the test probe and the control unit. Furthermore, the embodiments relate to a method for the non-destructive ultrasound testing of workpieces.


Find Patent Forward Citations

Ratering, Ralf. (2019). Device for the non-destructive ultrasound testing of workpieces with improved handling and method (U.S. Patent No. 10241087). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10241087

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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