The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2019

Filed:

Oct. 18, 2013
Applicants:

Andrew Edward Birnie, Bearsden, GB;

Robert Moran, Largs, GB;

Philippe Mounier, Tournefeuille, FR;

Alistair Paul Robertson, Glasgow, GB;

Inventors:

Andrew Edward Birnie, Bearsden, GB;

Robert Moran, Largs, GB;

Philippe Mounier, Tournefeuille, FR;

Alistair Paul Robertson, Glasgow, GB;

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/32 (2006.01); G06F 1/28 (2006.01);
U.S. Cl.
CPC ...
G06F 1/3206 (2013.01); G06F 1/28 (2013.01); G06F 1/3243 (2013.01);
Abstract

A method of detecting overcurrent events within at least one electronic device, and an overcurrent detection module therefor. The method comprises receiving at least one current requirement indication from at least one electronic device, determining at least one overcurrent value based at least partly on the received at least one current requirement indication, receiving at least one indication of at least one input current flow for the at least one electronic device, and determining that an overcurrent event is occurring if the indicated at least one input current flow for the at least one electronic device exceeds the determined at least one overcurrent value.


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