The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2019

Filed:

Jul. 22, 2015
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Sanjeev Kaushal, San Jose, CA (US);

Sukesh Janubhai Patel, Cupertino, CA (US);

Wolfgang Polak, Sunnyvale, CA (US);

Orion Wolfe, Oakland, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); G05B 19/4065 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4065 (2013.01); G05B 2219/37242 (2013.01); G05B 2219/37245 (2013.01); G05B 2219/45031 (2013.01);
Abstract

Systems and techniques to facilitate tool failure analysis associated with fabrication processes are presented. A monitoring component determines a candidate tool failure associated with one or more fabrication tools based on sensor data generated by a set of sensors associated with the one or more fabrication tools. A signature component generates a signature dataset for the candidate tool failure based on data associated with the one or more fabrication tools. A comparison component compares the candidate tool failure to at least one previously determined tool failure based on the signature dataset and at least one other signature dataset associated with the at least one previously determined tool failure.


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