The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2019

Filed:

Oct. 28, 2015
Applicant:

Advantest Corporation, Nerima-ku, Tokyo, JP;

Inventor:

Yasuhide Kuramochi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/487 (2006.01); C12Q 1/6869 (2018.01);
U.S. Cl.
CPC ...
G01N 33/48721 (2013.01); C12Q 1/6869 (2013.01);
Abstract

A measurement apparatus is provided that measures a current signal Ithat flows through a device under test. A transimpedance amplifier converts the current signal Iinto a voltage signal V. A digitizer converts the voltage signal Vinto first digital data. A digital signal processing unit performs signal processing on the first digital data, and controls the measurement apparatus. The measurement apparatus has a configuration comprising two separate modules, i.e., a probe module which is located in the vicinity of the device under test during a measurement, and a backend module connected to the probe module via at least one cable. The transimpedance amplifier is built into the probe module.


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