The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
Mar. 10, 2016
Min Chul Park, Hwaseong-si, KR;
Dae Sin Kim, Hwaseong-si, KR;
Sat Byul Kim, Hwaseong-si, KR;
Sae Jin Kim, Osan-si, KR;
Zhiliang Xia, Hwaseong-si, KR;
Je Hyun Lee, Suwon-si, KR;
Min Chul Park, Hwaseong-si, KR;
Dae Sin Kim, Hwaseong-si, KR;
Sat Byul Kim, Hwaseong-si, KR;
Sae Jin Kim, Osan-si, KR;
Zhiliang Xia, Hwaseong-si, KR;
Je Hyun Lee, Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Abstract
Provided are a method and system for analyzing grains using a high-resolution transmission electron microscopy (HRTEM) image. The method relates to analyzing nanometer grains, and includes receiving an HRTEM image, setting local windows each having a predetermined size for the HRTEM image, performing at least one Fast Fourier transformation on pixel data determined by the local windows to calculate local transformation data; and analyzing grains based on the local transformation data.