The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
Mar. 31, 2017
Mitutoyo Corporation, Kanagawa-ken, JP;
Scott Ellis Hemmings, Edmonds, WA (US);
Andrew Patzwald, Kirkland, WA (US);
Mitutoyo Corporation, Kanagawa-ken, JP;
Abstract
A method is disclosed for operating a coordinate measuring machine (CMM) including a workpiece scanning probe. The method provides two different measurement sampling period durations in the scanning probe: a first shorter sampling duration provides a faster measurement having a first accuracy, a second longer sampling duration provides a slower measurement having a second (better) accuracy. The shorter sampling duration may be repeatedly interleaved or alternated with the longer sampling duration to provide sufficient accuracy and response time for motion control purposes during ongoing operation of the CMM. The longer sampling duration may provide high accuracy probe measurements to combine with position coordinate values from encoders located on motion axes of the CMM (outside the scanning probe) to provide high accuracy workpiece measurements at a desired frequency, or upon demand. A probe measurement timing subsystem may determine initiation times of the first and second sampling durations.