The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Nov. 22, 2016
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventors:

Michael Thomason, Blackfoot, ID (US);

Mohammed Tanvir Quddus, Chandler, AZ (US);

James Morgan, Chandler, AZ (US);

Mihir Mudholkar, Tempe, AZ (US);

Scott Donaldson, Pocatello, ID (US);

Gordon M. Grivna, Mesa, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 29/872 (2006.01); H01L 21/285 (2006.01); H01L 21/324 (2006.01); H01L 21/768 (2006.01); H01L 29/40 (2006.01); H01L 29/47 (2006.01); H01L 29/66 (2006.01); H01L 21/3213 (2006.01);
U.S. Cl.
CPC ...
H01L 21/28537 (2013.01); H01L 21/2855 (2013.01); H01L 21/28518 (2013.01); H01L 21/28568 (2013.01); H01L 21/324 (2013.01); H01L 21/76883 (2013.01); H01L 21/76889 (2013.01); H01L 29/401 (2013.01); H01L 29/47 (2013.01); H01L 29/475 (2013.01); H01L 29/66143 (2013.01); H01L 29/8725 (2013.01); H01L 21/32134 (2013.01);
Abstract

A number of variations may include a method that may include depositing a first layer on a first semiconductor layer in an overlying position with respect to at least one trench structure formed in the first semiconductor epi layer. The first layer may include a first metal and a second metal. A second layer may comprise a material constructed and arranged to scavenge semiconductor material migrating from the first semiconductor layer during annealing may be deposited over the first layer. The first semiconductor layer may be subjected to at least a first annealing act to provide a first structure. At least a portion of the first structure may be stripped to remove any of the first layer not reacted with the semiconductor material to form a Schottky barrier structure during the first annealing act.


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