The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Jan. 28, 2016
Freescale Semiconductor, Inc., Austin, TX (US);
Joseph C. Circello, Phoenix, AZ (US);
David J. Schimke, Phoenix, AZ (US);
NXP USA, Inc., Austin, TX (US);
Abstract
Multi-dimensional parity checker (MDPC) systems and related methods are disclosed to check parity of data regions within external memories. In one embodiment, the MDPC system includes a control register and a parity checker. The parity checker receives data segments accessed from the data region. The parity checker generates and accumulates multi-dimensional parity bits for the data segments and subsequently compares accumulated bits to expected multi-dimensional parity bits to generate multi-dimensional error syndrome bits representing identified comparison errors. The parity checker also determines a syndrome state based upon the multi-dimensional syndrome bits and stores the syndrome state within the control register. The parity checker operates in different modes based upon different values stored in an operational mode field of the control register. The parity checker can operate in a real-time error correction mode to correct errors within the data region from subsequent random accesses by components within the integrated circuit.