The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Jan. 24, 2014
Applicant:

Rigaku Corporation, Akishima-shi, Tokyo, JP;

Inventors:

Kazuyuki Matsushita, Tokyo, JP;

Takuto Sakumura, Tokyo, JP;

Yasukazu Nakaye, Tokyo, JP;

Assignee:

RIGAKU CORPORATION, Akishima-Shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 7/00 (2006.01); G01T 1/29 (2006.01); G01N 23/087 (2018.01);
U.S. Cl.
CPC ...
G01T 1/2914 (2013.01); G01N 23/087 (2013.01); G01T 7/005 (2013.01);
Abstract

An X-ray data processing apparatus for processing X-ray data that is obtained by simultaneously measuring X-rays of multiple wavelengths. The apparatus includes a management unitto receive and manage X-ray data that is detected by a detector, a calculation unitwhich calculates a detection amount of charge sharing events in lower energy side data caused by higher energy X-ray, based on the higher energy side data obtained using a threshold value on a higher energy side and the lower energy side data obtained using a threshold value on a lower energy side of the received X-ray data, and a correction unitto reconfigure the lower energy side data using the calculated detection amount. The apparatus can remove a residual image of an X-ray on a higher energy side which remains in data on a lower energy side.


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