The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Jul. 19, 2010
Applicant:
David A. Hayner, Austin, TX (US);
Inventor:
David A. Hayner, Austin, TX (US);
Assignee:
NXP USA, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/00 (2013.01); G01C 25/00 (2006.01); G01D 18/00 (2006.01); G01F 19/00 (2006.01); B60W 50/02 (2012.01); G01N 27/416 (2006.01); B60W 50/00 (2006.01);
U.S. Cl.
CPC ...
B60W 50/0205 (2013.01); G01D 18/00 (2013.01); G01N 27/4163 (2013.01); B60W 2050/0031 (2013.01); B60W 2420/90 (2013.01); B60W 2520/105 (2013.01); B60W 2520/125 (2013.01); B60W 2520/14 (2013.01);
Abstract
A microcontroller-based method and apparatus are described for measuring motions signals () with a plurality of inertial sensors (-) contained within a device package housing and validating () a first measured motion signal (e.g., Ω) by generating at least a first estimated value Ωfor the first motion signal (e.g.,) based on at least a second measured motion signal (e.g., A) and for comparing the first estimated value for the first motion signal () to the first measured motion signal Ωin order to validate the first measured motion signal Ω.