The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Nov. 09, 2015
Applicant:

Moba Group B.v., Barneveld, NL;

Inventors:
Assignee:

MOBA GROUP B.V., Barneveld, NL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/48 (2006.01); A01K 43/00 (2006.01); G01N 3/40 (2006.01); G01N 29/04 (2006.01); G01N 33/08 (2006.01);
U.S. Cl.
CPC ...
A01K 43/00 (2013.01); G01N 3/40 (2013.01); G01N 3/48 (2013.01); G01N 29/045 (2013.01); G01N 33/08 (2013.01);
Abstract

This invention relates to a method and apparatus for examining eggs, in particular for determining eggshell characteristics of eggs, the method comprising, Such a manner of detection can be suitably applied to sorting machines for eggs. With this methodology, in a short time, for a very large number of products, such as eggs in the present case, a quality parameter such as the strength and/or stiffness can be determined. With such determinations, in an advantageous manner, high requirements set in many fields of technology and industry can be met.


Find Patent Forward Citations

De Ketelaere, Bart. (2019). Method and apparatus for examining eggs (U.S. Patent No. 10206375). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10206375

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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