The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

May. 17, 2018
Applicant:

Fuji Electric Co., Ltd., Kanagawa, JP;

Inventors:

Toru Muramatsu, Matsumoto, JP;

Hong-fei Lu, Hino, JP;

Haruo Nakazawa, Matsumoto, JP;

Assignee:

FUJI ELECTRIC CO., LTD., Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/739 (2006.01); H01L 21/265 (2006.01); H01L 29/417 (2006.01); H01L 29/06 (2006.01); H01L 21/225 (2006.01); H01L 29/10 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7395 (2013.01); H01L 21/2253 (2013.01); H01L 21/26506 (2013.01); H01L 29/0619 (2013.01); H01L 29/417 (2013.01); H01L 29/66333 (2013.01); H01L 29/1095 (2013.01);
Abstract

A semiconductor device is provided, the semiconductor device including a base layer of a first conductivity type having a MOS gate structure formed on a front surface side thereof, a collector layer of a second conductivity type formed on a rear surface side of the base layer, and into which a first dopant and a second dopant which is different from the first dopant are implanted, and a collector electrode formed on a rear surface side of the collector layer, wherein an impurity concentration peak of the second dopant is at a deeper position from the rear surface of the collector layer than an impurity concentration peak of the first dopant, and magnitude of the impurity concentration peak of the second dopant is larger than 1/100 of magnitude of the impurity concentration peak of the first dopant.


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