The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2019
Filed:
Jan. 24, 2017
Applicant:
Synopsys, Inc., Mountain View, CA (US);
Inventors:
Jyotirmoy Saikia, Bangalore, IN;
Rohit Kapur, Cupertino, CA (US);
Assignee:
Synopsys, Inc., Mountain View, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3177 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31707 (2013.01); G01R 31/3177 (2013.01); G01R 31/318544 (2013.01); G01R 31/318547 (2013.01);
Abstract
A method for masking scan chains in a test circuit of an integrated circuit is disclosed. A test pattern to be fed into the test circuit of the integrated circuit is generated. The generated test pattern can be used for detecting a primary fault, one or more secondary faults, and one or more tertiary faults. A mask to mask the output of the scan chains of the test circuit is generated. If a condition is not met, a mask that increases the total number of detectable faults is generated. If the condition is met, a mask that protects the primary fault of the test pattern is generated.