The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

Oct. 21, 2014
Applicant:

Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;

Inventors:

Daisuke Morishima, Tokyo, JP;

Kohshi Maeda, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/10 (2006.01); C12Q 1/6813 (2018.01);
U.S. Cl.
CPC ...
G01N 35/00594 (2013.01); C12Q 1/6813 (2013.01); G01N 35/00663 (2013.01); G01N 35/1002 (2013.01); G01N 35/00693 (2013.01); G01N 2035/00673 (2013.01); G01N 2035/1034 (2013.01);
Abstract

Provided is an automatic analysis device capable of reducing a reagent cost. In the present invention, in each mixed reagent preparation cycle, an amount of mixed reagent for N analyses is mixed and prepared, and an amount of mixed reagent for one analysis is dispensed from the amount of mixed reagent for N analyses and used to analyze one sample. Minimum (Nmin) and maximum (Nmax) values for N are determined for a control unit beforehand, and if the analysis of J samples is requested, the control unit sets the value of N at the time of a mixed reagent preparation cycle within a range from Nmin to Nmax so as to minimize the remaining mixed reagent.


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