The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2019
Filed:
May. 27, 2014
Applicant:
Kaneka Corporation, Osaka, JP;
Inventors:
Yasunori Tanaka, Ishikawa, JP;
Masahiro Ishida, Ishikawa, JP;
Hiroyasu Hagi, Hyogo, JP;
Atsushi Mizobuchi, Osaka, JP;
Assignee:
Kaneka Corporation, , JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 17/00 (2006.01); G01N 3/60 (2006.01); G01K 7/00 (2006.01); G01N 25/18 (2006.01); G01N 33/36 (2006.01); H05H 1/30 (2006.01);
U.S. Cl.
CPC ...
G01N 25/18 (2013.01); G01N 33/367 (2013.01); H05H 1/30 (2013.01);
Abstract
An arc-resistance performance evaluation device includes a plasma generator that generates plasma; and a stand on which a sheet-like test piece is placed so that the plasma generated in the plasma generator is irradiated on a front surface of said test piece, the stand includes a temperature measurement device that measures a temperature on a back surface of said test piece.