The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2019

Filed:

Aug. 29, 2016
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Mukta Ghate Farooq, Hopewell Junction, NY (US);

John Matthew Safran, Wappingers Falls, NY (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/40 (2006.01); H01L 23/498 (2006.01); H01L 21/48 (2006.01); H01L 23/48 (2006.01); H01L 23/522 (2006.01); H01L 23/532 (2006.01);
U.S. Cl.
CPC ...
H01L 23/49827 (2013.01); H01L 21/486 (2013.01); H01L 21/4846 (2013.01); H01L 23/481 (2013.01); H01L 23/498 (2013.01); H01L 23/49838 (2013.01); H01L 23/5226 (2013.01); H01L 23/5329 (2013.01);
Abstract

An IC structure and related method are provided. The IC structure includes: a semiconductor substrate and a TSV disposed within the semiconductor substrate. A first interconnect layer includes a plurality of V0 vias disposed on the TSV, where the plurality of V0 vias are positioned laterally within an upper surface area of the TSV. At least one second interconnect layer disposed over the first interconnect layer includes a plurality of vias laterally positioned outside of a keep out zone positioned over the TSV. The method includes forming a first interconnect layer including a plurality of V0 vias disposed on a TSV, the V0 vias positioned laterally within an upper surface area of the TSV, and forming at least one second interconnect layer disposed over the first interconnect layer and including a plurality of vias laterally positioned outside of a keep out zone positioned over the TSV.


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