The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2019

Filed:

Sep. 22, 2017
Applicant:

Bruker Nano Gmbh, Berlin, DE;

Inventors:

Meiken Falke, Jahnsdorf, DE;

Waldemar Hahn, Berlin, DE;

Assignee:

Bruker Nano GmbH, Berlin, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); H01J 37/244 (2006.01); G01N 23/2252 (2018.01);
U.S. Cl.
CPC ...
G01N 23/2252 (2013.01); G01T 1/244 (2013.01); H01J 37/244 (2013.01); H01J 2237/2442 (2013.01); H01J 2237/2445 (2013.01); H01J 2237/2446 (2013.01); H01J 2237/26 (2013.01);
Abstract

The invention relates to a photon detector (), in particular an x-ray detector, in the form of a measurement finger, which extends along a detector axis () and has a detector head () at a first end of the measurement finger, wherein the detector head () comprises a plurality of at least two detector modules (), each comprising a sensor chip () sensitive to photon radiation (), in particular x-radiation, said sensor chip having an exposed end face () and a face facing away from the end face (), wherein the detector modules () are arranged around the detector axis () in a plane () extending orthogonally to the detector axis ().


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