The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
May. 27, 2011
Eberhard Neuser, Wunstorf, DE;
Alexander Suppes, Garbsen, DE;
Nils Rothe, Hannover, DE;
Michael Hoetter, Gehrden, DE;
Anja Frost, Bremen, DE;
Eberhard Neuser, Wunstorf, DE;
Alexander Suppes, Garbsen, DE;
Nils Rothe, Hannover, DE;
Michael Hoetter, Gehrden, DE;
Anja Frost, Bremen, DE;
GE SENSING & INSPECTION TECHNOLOGIES GMBH, Huerth, DE;
Abstract
A method of using computed tomography for determining a volumetric representation of a sample, involving a first reconstruction for reconstructing first reconstructed volume data of the sample from first x-ray projection data of the sample taken by an x-ray system, a second reconstruction for reconstructing second reconstructed volume data of the sample from second x-ray projection data of the sample taken by an x-ray system, characterized by calculating first individual confidence measures for single voxels of the first reconstructed volume data, calculating second individual confidence measures for single voxels of the second reconstructed volume data, and calculating, in a subsequent step, at least one resulting set of individual values for each voxel based on the first individual confidence measures and the second individual confidence measures.