The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Sep. 28, 2017
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Johannes Georg Laven, Taufkirchen, DE;

Moriz Jelinek, Villach, AT;

Hans-Joachim Schulze, Taufkirchen, DE;

Werner Schustereder, Villach, AT;

Michael Stadtmueller, Villach, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 21/324 (2006.01); H01L 21/8234 (2006.01); H01L 29/739 (2006.01); H01L 21/263 (2006.01); H01L 21/265 (2006.01); H01L 21/322 (2006.01); H01L 29/36 (2006.01); H01L 29/861 (2006.01); H01L 29/167 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0692 (2013.01); H01L 21/263 (2013.01); H01L 21/26506 (2013.01); H01L 21/324 (2013.01); H01L 21/3221 (2013.01); H01L 21/8234 (2013.01); H01L 22/20 (2013.01); H01L 29/167 (2013.01); H01L 29/36 (2013.01); H01L 29/7393 (2013.01); H01L 29/8611 (2013.01); H01L 22/12 (2013.01); H01L 22/14 (2013.01);
Abstract

A method of manufacturing a semiconductor device includes determining information that indicates an extrinsic dopant concentration and an intrinsic oxygen concentration in a semiconductor wafer. On the basis of information about the extrinsic dopant concentration and the intrinsic oxygen concentration as well as information about a generation rate or a dissociation rate of oxygen-related thermal donors in the semiconductor wafer, a process temperature gradient is determined for generating or dissociating oxygen-related thermal donors to compensate for a difference between a target dopant concentration and the extrinsic dopant concentration.


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