The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Jan. 26, 2016
Applicant:
Freescale Semiconductor, Inc., Austin, TX (US);
Inventors:
Kumar Abhishek, Austin, TX (US);
Regis Gubian, Pibrac, FR;
Sakshi Gupta, Delhi, IN;
Sunny Gupta, Noida, IN;
Kushal Kamal, New Delhi, IN;
Assignee:
NXP USA, INC., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G05F 3/08 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2884 (2013.01); G05F 3/08 (2013.01);
Abstract
An integrated circuit and a method of self-testing the integrated circuit are provided. The method comprises: generating a reference voltage at an output of a reference circuit; initiating a test of the reference circuit during a test mode; determining whether the test of the reference circuit passes; and comparing, if the test of the reference circuit passes, a first voltage with the reference voltage. The disclosed test method provides for more complete testing of the integrated circuit.