The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Nov. 19, 2015
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Gregory G. Freeman, Wappingers Falls, NY (US);

Siyuranga Koswatta, Carmel, NY (US);

Paul S. McLaughlin, Poughkeepsie, NY (US);

Daniel J. Poindexter, Cornwall-on-Hudson, NY (US);

J. Campbell Scott, Los Gatos, CA (US);

Scott Taylor, Austin, TX (US);

Gregory Uhlmann, Rochester, MN (US);

James D. Warnock, Somers, NY (US);

Assignee:

Globalfoundries Inc., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/36 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2858 (2013.01); G01R 31/2884 (2013.01);
Abstract

A sensor for on-chip monitoring the effects of operating conditions on a circuit, Integrated Circuit (IC) chips including the sensors, and a method of monitoring operating condition effects on-chip circuits, e.g., for the occurrence of electromigration. The sensor includes a multi-fingered driver associated with a monitored circuit, sensitive to known circuit parameter sensitivities. Sense and control logic circuit selectively driving the multi-fingered driver, and selectively monitoring for an expected multi-fingered driver response.


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