The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 2019
Filed:
Jun. 11, 2015
Applicant:
Universal Instruments Corporation, Conklin, NY (US);
Inventors:
John William Herman, Binghamton, NY (US);
John J. Pichura, Kirkwood, NY (US);
Assignee:
UNIVERSAL INSTRUMENTS CORPORATION, Conklin, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65G 49/06 (2006.01); H05K 13/08 (2006.01);
U.S. Cl.
CPC ...
B65G 49/064 (2013.01); H05K 13/0818 (2018.08); B65G 2249/04 (2013.01);
Abstract
A test device is disclosed for verifying the accuracy of a pick and place process. The test device includes a surface configured to receive components, and a ferromagnetic layer located under the surface. A system is further disclosed including the test device and a plurality of components each including a magnetic element, the plurality of components configured to be received by a plurality of pockets of the test device. A method of picking and placing a component onto the test device is further disclosed.