The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2019

Filed:

Dec. 04, 2015
Applicants:

Minjong Kim, Hwaseong-si, KR;

Jung-soo Yoon, Hwaseong-si, KR;

Jang-hee Lee, Yongin-si, KR;

Jongwon Hong, Hwaseong-si, KR;

Inventors:

Minjong Kim, Hwaseong-si, KR;

Jung-soo Yoon, Hwaseong-si, KR;

Jang-Hee Lee, Yongin-si, KR;

Jongwon Hong, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/455 (2006.01); C23C 16/50 (2006.01); C23C 16/505 (2006.01); H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
C23C 16/455 (2013.01); C23C 16/505 (2013.01); H01J 37/32 (2013.01);
Abstract

A deposition apparatus includes a chuck in a process chamber, the chuck having a top surface on which a substrate is loaded, a showerhead disposed over the chuck, and a fence extension disposed in the process chamber. Plasma is generated in a space between the showerhead and the loaded substrate during a deposition process. The fence extension at least partially confines the plasma in the space during the deposition process, thereby enabling improved thickness uniformity and reliability of a layer deposited on the loaded substrate during the deposition process.


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