The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2019

Filed:

Dec. 09, 2016
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Donghyun Roh, Suwon-si, KR;

Pankwi Park, Incheon, KR;

Dongsuk Shin, Yongin-si, KR;

Chulwoong Lee, Suwon-si, KR;

Nae-in Lee, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 21/306 (2006.01); H01L 29/66 (2006.01); H01L 29/423 (2006.01); H01L 29/06 (2006.01); H01L 21/762 (2006.01); H01L 29/165 (2006.01); H01L 21/8234 (2006.01); H01L 29/161 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7849 (2013.01); H01L 21/30604 (2013.01); H01L 21/76224 (2013.01); H01L 21/823412 (2013.01); H01L 21/823418 (2013.01); H01L 21/823468 (2013.01); H01L 21/823481 (2013.01); H01L 29/0649 (2013.01); H01L 29/161 (2013.01); H01L 29/165 (2013.01); H01L 29/42376 (2013.01); H01L 29/66477 (2013.01); H01L 29/66553 (2013.01); H01L 29/7848 (2013.01);
Abstract

According to embodiments of the inventive concept, a gate electrode is formed on a substrate, and a first spacer, a second spacer, and a third spacer are sequentially formed on a sidewall of the gate electrode. The substrate is etched to form a recess region. A compressive stress pattern is formed in the recess region. A protective spacer is formed on a sidewall of the third spacer. When the recess region is formed, a lower portion of the second spacer is removed to form a gap region between the first and third spacers. The protective spacer fills the gap region.


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