The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2019

Filed:

Jun. 08, 2016
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Rainer Markus Schaller, Donau, DE;

Goran Keser, Munich, DE;

Manuel Harrant, Taufkirchen, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/07 (2006.01); G01R 33/09 (2006.01); H01L 25/04 (2014.01); H01L 43/02 (2006.01); H01L 43/04 (2006.01); H01L 43/06 (2006.01); H01L 43/08 (2006.01); H01L 43/12 (2006.01);
U.S. Cl.
CPC ...
G01R 33/07 (2013.01); G01R 33/09 (2013.01); H01L 25/04 (2013.01); H01L 43/02 (2013.01); H01L 43/04 (2013.01); H01L 43/06 (2013.01); H01L 43/08 (2013.01); H01L 43/12 (2013.01);
Abstract

A chip package, a chip package system, a method of manufacturing a chip package, and a method of operating a chip package including: a first sensor configured to measure a magnetic field component up to a maximum magnetic field value; a second sensor configured to measure the magnetic field component beyond the maximum magnetic field value; and a circuit coupled to the first sensor and the second sensor and configured to receive at least one sensor signal from at least one of the first sensor and the second sensor, wherein the circuit is further configured to select the first sensor or the second sensor to measure the magnetic field component based on the received sensor signal.


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