The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Nov. 27, 2017
Applicant:

Rambus Inc., Sunnyvale, CA (US);

Inventor:

Kenneth C. Dyer, Pleasanton, CA (US);

Assignee:

Rambus Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/06 (2006.01); H03M 1/08 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1255 (2013.01); H03M 1/06 (2013.01); H03M 1/0673 (2013.01); H03M 1/08 (2013.01); H03M 1/0836 (2013.01); H03M 1/12 (2013.01); H03M 1/1215 (2013.01);
Abstract

An apparatus comprising M time-interleaved analog to digital converters (ADC) that sample an input signal at M sampling phases, wherein M is equal to or greater than 4. A phase control circuit adjusts at least M−1 sampling phases of the M sampling phases. The phase control circuit comprises M−1 phase error detector circuits. Each phase error detector circuit detects a corresponding phase error for a corresponding sampling phase of the M−1 sampling phases based on a sample captured at a sampling phase of the M sampling phases immediately preceding the corresponding sampling phase and a sample captured at a sampling phase of the M sampling phases immediately subsequent to the corresponding sampling phase.


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