The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2019

Filed:

Nov. 03, 2016
Applicant:

Korea Electronics Technology Institute, Seongnam-si, Gyeonggi-do, KR;

Inventors:

Choong Sang Cho, Seongnam-si, KR;

Hwa Seon Shin, Yongin-si, KR;

Young Han Lee, Yongin-si, KR;

Joo Hyung Kang, Daejeon, KR;

Assignee:

Korea Electronics Technology Institute, Seongnam-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/30016 (2013.01);
Abstract

Provided herein is a topological derivatives (TDs)-based image segmentation method and system using heterogeneous image features data. The image segmentation method according to an embodiment of the present disclosure involves calculating TDs having each of the heterogeneous image features data as an input value, and segmenting an image into a plurality of regions using the calculated TDs. Accordingly, performance may be improved, and robustness against noise may be further improved.


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