The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2019
Filed:
Sep. 05, 2012
Qizhang Chao, Palo Alto, CA (US);
Neeti K. Bhatnagar, San Jose, CA (US);
George F. Frazier, Lawrence, KS (US);
Tuay-ling Kathy Lang, Boxborough, MA (US);
Andrew Wilmot, Carlisle, MA (US);
Qizhang Chao, Palo Alto, CA (US);
Neeti K. Bhatnagar, San Jose, CA (US);
George F. Frazier, Lawrence, KS (US);
Tuay-Ling Kathy Lang, Boxborough, MA (US);
Andrew Wilmot, Carlisle, MA (US);
Cadence Design Systems, Inc., San Jose, CA (US);
Abstract
An apparatus and method for determining an optimal global quantum value for use in event-driven simulations of a device are disclosed herein. The device is simulated using information representative of a device design corresponding to the device, the simulation of the device comprising an event-driven simulation using a provisional global quantum value. Events included in a sequence chart corresponding to the simulation using the provisional global quantum value are compared against expected events. Based on the comparison detecting at least one of the expected events being absent in the sequence chart, providing the optimal global quantum value as being smaller than the provisional global quantum value. Based on the comparison detecting no difference between the events in the sequence chart and the expected events, providing the optimal global quantum value as being larger than the provisional global quantum value.